Grand won an "Award for outstanding product exhibition" in IC China 2013 2013-11-13
On 13 – 15 November 2013, the 11th China International Semiconductor Expo and the eighty-second session of China’s Electronics Fair and Forum was held in Shanghai New International Expo Center. Grand exhibited the latest independent research and development of new products - GIS129 tape auto optical inspection system and GIS130 Pick and Place Test Handler, has attracted much attention.
The Expo had more than 1,300 exhibitors, the exhibition area of about 60,000 square meters, has attracted well-known semiconductor companies and foreign exhibitors. On site of Grand booth, our device continuously simulated production demonstration which attracted many viewers, GIS130 Pick and Place Test Handler due to the advanced technology and fine workmanship are highly praised by the market. The exhibition juries also come to our booth for exhibition evaluation of GIS130, which unanimously passed the assessment, and awarded the IC China 2013 "Award for outstanding product exhibition". (JOY)
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